Session Details

	Asia Pacific

Tutorial
4:45 to 5:30 p.m. Friday August 19, 2005

Reliability Growth Management and Data Analysis

In order to attain reliability objectives, early system prototypes are often subjected to reliability growth testing. This testing may be specifically dedicated to reliability or the testing may be integrated into existing engineering development tests. When failure modes are uncovered during the testing, they are either corrected or not corrected in accordance with the reliability growth management strategy. For a particular program, the management strategy is a key factor in whether or not the desired reliability is attained. To properly manage the reliability growth process, the reliability currently achieved and the projected reliability impact of proposed future corrective actions must be appropriately measured for a particular management strategy. If the projected reliability is not on track to meet the desired goal then the management strategy can be changed.

This tutorial will present a proven reliability growth management strategy structure together with widely used models and methods for evaluating the reliability growth based on test data and other engineering input. Several case studies are presented, which illustrate the application of the management strategy concepts and growth models to actual development programs. The models and methods presented in this tutorial are designed for real world applications and are useful to reliability engineers and program management.

Larry H. Crow
Crow Reliability Resources
Madison, Alabama

Dr. Crow was chief of the Reliability Methodology Office at the U.S. Army Materiel Systems Analysis Activity (AMSAA). He developed the Crow (AMSAA) model and the Crow Projection model, which have been incorporated into U.S. DoD military handbooks as well as national and international standards and service regulations on reliability. Dr. Crow chaired the Tri-Service Committee to develop U.S. MIL-HDBK-189, Reliability Growth Management and is the principal author of that document. He is also the principal author of the IEC 61164, Reliability Growth-Statistical Tests and Estimation Methods. He developed the widely used N.H.P.P. Power Law model for analyzing repairable systems reliability, which is featured in the new IEC 61710, Goodness-of-Fit and Estimation Methods for the Power Law Model.

Organized by ReliaSoft Corporation